TCK Results
As required by the Eclipse Foundation Technology Compatibility Kit License, following is a summary of the TCK results for releases of MicroProfile Metrics 3.0.
Open Liberty TCK build - cl210120201202-1100 MicroProfile Metrics 3.0 Certification Summary
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Product Name, Version and download URL (if applicable):
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Specification Name, Version and download URL:
MicroProfile Metrics 3.0
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Public URL of TCK Results Summary:
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Java runtime used to run the implementation:
Java 8 and Java 11
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Summary of the information for the certification environment, operating system, cloud, …:
macOS
Test results:
------------------------------------------------------------------------------- Test set: org.eclipse.microprofile.metrics.tck.MetricFilterTest ------------------------------------------------------------------------------- Tests run: 1, Failures: 0, Errors: 0, Skipped: 0, Time elapsed: 4.016 sec - in org.eclipse.microprofile.metrics.tck.MetricFilterTest ------------------------------------------------------------------------------- Test set: org.eclipse.microprofile.metrics.tck.MetricIDTest ------------------------------------------------------------------------------- Tests run: 1, Failures: 0, Errors: 0, Skipped: 0, Time elapsed: 3.335 sec - in org.eclipse.microprofile.metrics.tck.MetricIDTest ------------------------------------------------------------------------------- Test set: org.eclipse.microprofile.metrics.tck.MetricRegistryTest ------------------------------------------------------------------------------- Tests run: 7, Failures: 0, Errors: 0, Skipped: 0, Time elapsed: 3.914 sec - in org.eclipse.microprofile.metrics.tck.MetricRegistryTest ------------------------------------------------------------------------------- Test set: org.eclipse.microprofile.metrics.tck.cdi.ApplicationScopedTimedMethodBeanTest ------------------------------------------------------------------------------- Tests run: 2, Failures: 0, Errors: 0, Skipped: 0, Time elapsed: 5.381 sec - in org.eclipse.microprofile.metrics.tck.cdi.ApplicationScopedTimedMethodBeanTest ------------------------------------------------------------------------------- Test set: org.eclipse.microprofile.metrics.tck.cdi.GaugeInjectionBeanTest ------------------------------------------------------------------------------- Tests run: 2, Failures: 0, Errors: 0, Skipped: 0, Time elapsed: 5.446 sec - in org.eclipse.microprofile.metrics.tck.cdi.GaugeInjectionBeanTest ------------------------------------------------------------------------------- Test set: org.eclipse.microprofile.metrics.tck.cdi.MeterInjectionBeanTest ------------------------------------------------------------------------------- Tests run: 2, Failures: 0, Errors: 0, Skipped: 0, Time elapsed: 3.396 sec - in org.eclipse.microprofile.metrics.tck.cdi.MeterInjectionBeanTest ------------------------------------------------------------------------------- Test set: org.eclipse.microprofile.metrics.tck.cdi.SimpleTimerInjectionBeanTest ------------------------------------------------------------------------------- Tests run: 2, Failures: 0, Errors: 0, Skipped: 0, Time elapsed: 7.011 sec - in org.eclipse.microprofile.metrics.tck.cdi.SimpleTimerInjectionBeanTest ------------------------------------------------------------------------------- Test set: org.eclipse.microprofile.metrics.tck.cdi.TimerInjectionBeanTest ------------------------------------------------------------------------------- Tests run: 2, Failures: 0, Errors: 0, Skipped: 0, Time elapsed: 8.375 sec - in org.eclipse.microprofile.metrics.tck.cdi.TimerInjectionBeanTest ------------------------------------------------------------------------------- Test set: org.eclipse.microprofile.metrics.tck.cdi.stereotype.StereotypeCountedClassBeanTest ------------------------------------------------------------------------------- Tests run: 2, Failures: 0, Errors: 0, Skipped: 0, Time elapsed: 3.384 sec - in org.eclipse.microprofile.metrics.tck.cdi.stereotype.StereotypeCountedClassBeanTest ------------------------------------------------------------------------------- Test set: org.eclipse.microprofile.metrics.tck.inheritance.InheritedGaugeMethodBeanTest ------------------------------------------------------------------------------- Tests run: 2, Failures: 0, Errors: 0, Skipped: 0, Time elapsed: 3.427 sec - in org.eclipse.microprofile.metrics.tck.inheritance.InheritedGaugeMethodBeanTest ------------------------------------------------------------------------------- Test set: org.eclipse.microprofile.metrics.tck.inheritance.InheritedSimplyTimedMethodBeanTest ------------------------------------------------------------------------------- Tests run: 2, Failures: 0, Errors: 0, Skipped: 0, Time elapsed: 3.507 sec - in org.eclipse.microprofile.metrics.tck.inheritance.InheritedSimplyTimedMethodBeanTest ------------------------------------------------------------------------------- Test set: org.eclipse.microprofile.metrics.tck.inheritance.InheritedTimedMethodBeanTest ------------------------------------------------------------------------------- Tests run: 2, Failures: 0, Errors: 0, Skipped: 0, Time elapsed: 3.946 sec - in org.eclipse.microprofile.metrics.tck.inheritance.InheritedTimedMethodBeanTest ------------------------------------------------------------------------------- Test set: org.eclipse.microprofile.metrics.tck.inheritance.VisibilitySimplyTimedMethodBeanTest ------------------------------------------------------------------------------- Tests run: 2, Failures: 0, Errors: 0, Skipped: 0, Time elapsed: 3.898 sec - in org.eclipse.microprofile.metrics.tck.inheritance.VisibilitySimplyTimedMethodBeanTest ------------------------------------------------------------------------------- Test set: org.eclipse.microprofile.metrics.tck.inheritance.VisibilityTimedMethodBeanTest ------------------------------------------------------------------------------- Tests run: 2, Failures: 0, Errors: 0, Skipped: 0, Time elapsed: 3.905 sec - in org.eclipse.microprofile.metrics.tck.inheritance.VisibilityTimedMethodBeanTest ------------------------------------------------------------------------------- Test set: org.eclipse.microprofile.metrics.tck.metrics.ConcreteExtendedTimedBeanTest ------------------------------------------------------------------------------- Tests run: 4, Failures: 0, Errors: 0, Skipped: 0, Time elapsed: 3.416 sec - in org.eclipse.microprofile.metrics.tck.metrics.ConcreteExtendedTimedBeanTest ------------------------------------------------------------------------------- Test set: org.eclipse.microprofile.metrics.tck.metrics.ConcreteTimedBeanTest ------------------------------------------------------------------------------- Tests run: 4, Failures: 0, Errors: 0, Skipped: 0, Time elapsed: 3.923 sec - in org.eclipse.microprofile.metrics.tck.metrics.ConcreteTimedBeanTest ------------------------------------------------------------------------------- Test set: org.eclipse.microprofile.metrics.tck.metrics.ConcurrentGaugeFunctionalTest ------------------------------------------------------------------------------- Tests run: 2, Failures: 0, Errors: 0, Skipped: 0, Time elapsed: 118.524 sec - in org.eclipse.microprofile.metrics.tck.metrics.ConcurrentGaugeFunctionalTest ------------------------------------------------------------------------------- Test set: org.eclipse.microprofile.metrics.tck.metrics.ConcurrentGaugeTest ------------------------------------------------------------------------------- Tests run: 3, Failures: 0, Errors: 0, Skipped: 0, Time elapsed: 3.476 sec - in org.eclipse.microprofile.metrics.tck.metrics.ConcurrentGaugeTest ------------------------------------------------------------------------------- Test set: org.eclipse.microprofile.metrics.tck.metrics.ConcurrentGaugedClassBeanTest ------------------------------------------------------------------------------- Tests run: 2, Failures: 0, Errors: 0, Skipped: 0, Time elapsed: 3.977 sec - in org.eclipse.microprofile.metrics.tck.metrics.ConcurrentGaugedClassBeanTest ------------------------------------------------------------------------------- Test set: org.eclipse.microprofile.metrics.tck.metrics.ConcurrentGaugedConstructorBeanTest ------------------------------------------------------------------------------- Tests run: 1, Failures: 0, Errors: 0, Skipped: 0, Time elapsed: 3.475 sec - in org.eclipse.microprofile.metrics.tck.metrics.ConcurrentGaugedConstructorBeanTest ------------------------------------------------------------------------------- Test set: org.eclipse.microprofile.metrics.tck.metrics.ConcurrentGaugedMethodBeanTest ------------------------------------------------------------------------------- Tests run: 4, Failures: 0, Errors: 0, Skipped: 0, Time elapsed: 5.476 sec - in org.eclipse.microprofile.metrics.tck.metrics.ConcurrentGaugedMethodBeanTest ------------------------------------------------------------------------------- Test set: org.eclipse.microprofile.metrics.tck.metrics.CountedClassBeanTest ------------------------------------------------------------------------------- Tests run: 2, Failures: 0, Errors: 0, Skipped: 0, Time elapsed: 3.891 sec - in org.eclipse.microprofile.metrics.tck.metrics.CountedClassBeanTest ------------------------------------------------------------------------------- Test set: org.eclipse.microprofile.metrics.tck.metrics.CountedMethodBeanTest ------------------------------------------------------------------------------- Tests run: 4, Failures: 0, Errors: 0, Skipped: 0, Time elapsed: 3.918 sec - in org.eclipse.microprofile.metrics.tck.metrics.CountedMethodBeanTest ------------------------------------------------------------------------------- Test set: org.eclipse.microprofile.metrics.tck.metrics.CountedMethodTagBeanTest ------------------------------------------------------------------------------- Tests run: 2, Failures: 0, Errors: 0, Skipped: 0, Time elapsed: 3.496 sec - in org.eclipse.microprofile.metrics.tck.metrics.CountedMethodTagBeanTest ------------------------------------------------------------------------------- Test set: org.eclipse.microprofile.metrics.tck.metrics.CounterFieldBeanTest ------------------------------------------------------------------------------- Tests run: 2, Failures: 0, Errors: 0, Skipped: 0, Time elapsed: 3.92 sec - in org.eclipse.microprofile.metrics.tck.metrics.CounterFieldBeanTest ------------------------------------------------------------------------------- Test set: org.eclipse.microprofile.metrics.tck.metrics.CounterTest ------------------------------------------------------------------------------- Tests run: 3, Failures: 0, Errors: 0, Skipped: 0, Time elapsed: 3.459 sec - in org.eclipse.microprofile.metrics.tck.metrics.CounterTest ------------------------------------------------------------------------------- Test set: org.eclipse.microprofile.metrics.tck.metrics.DefaultNameMetricMethodBeanTest ------------------------------------------------------------------------------- Tests run: 1, Failures: 0, Errors: 0, Skipped: 0, Time elapsed: 3.386 sec - in org.eclipse.microprofile.metrics.tck.metrics.DefaultNameMetricMethodBeanTest ------------------------------------------------------------------------------- Test set: org.eclipse.microprofile.metrics.tck.metrics.GaugeMethodBeanTest ------------------------------------------------------------------------------- Tests run: 2, Failures: 0, Errors: 0, Skipped: 0, Time elapsed: 3.917 sec - in org.eclipse.microprofile.metrics.tck.metrics.GaugeMethodBeanTest ------------------------------------------------------------------------------- Test set: org.eclipse.microprofile.metrics.tck.metrics.GaugeTest ------------------------------------------------------------------------------- Tests run: 1, Failures: 0, Errors: 0, Skipped: 0, Time elapsed: 4.417 sec - in org.eclipse.microprofile.metrics.tck.metrics.GaugeTest ------------------------------------------------------------------------------- Test set: org.eclipse.microprofile.metrics.tck.metrics.HistogramFieldBeanTest ------------------------------------------------------------------------------- Tests run: 2, Failures: 0, Errors: 0, Skipped: 0, Time elapsed: 3.98 sec - in org.eclipse.microprofile.metrics.tck.metrics.HistogramFieldBeanTest ------------------------------------------------------------------------------- Test set: org.eclipse.microprofile.metrics.tck.metrics.HistogramTest ------------------------------------------------------------------------------- Tests run: 15, Failures: 0, Errors: 0, Skipped: 0, Time elapsed: 5.483 sec - in org.eclipse.microprofile.metrics.tck.metrics.HistogramTest ------------------------------------------------------------------------------- Test set: org.eclipse.microprofile.metrics.tck.metrics.MeterTest ------------------------------------------------------------------------------- Tests run: 2, Failures: 0, Errors: 0, Skipped: 0, Time elapsed: 78.807 sec - in org.eclipse.microprofile.metrics.tck.metrics.MeterTest ------------------------------------------------------------------------------- Test set: org.eclipse.microprofile.metrics.tck.metrics.MeteredClassBeanTest ------------------------------------------------------------------------------- Tests run: 2, Failures: 0, Errors: 0, Skipped: 0, Time elapsed: 3.912 sec - in org.eclipse.microprofile.metrics.tck.metrics.MeteredClassBeanTest ------------------------------------------------------------------------------- Test set: org.eclipse.microprofile.metrics.tck.metrics.MeteredConstructorBeanTest ------------------------------------------------------------------------------- Tests run: 1, Failures: 0, Errors: 0, Skipped: 0, Time elapsed: 3.331 sec - in org.eclipse.microprofile.metrics.tck.metrics.MeteredConstructorBeanTest ------------------------------------------------------------------------------- Test set: org.eclipse.microprofile.metrics.tck.metrics.MeteredMethodBeanTest ------------------------------------------------------------------------------- Tests run: 3, Failures: 0, Errors: 0, Skipped: 0, Time elapsed: 3.003 sec - in org.eclipse.microprofile.metrics.tck.metrics.MeteredMethodBeanTest ------------------------------------------------------------------------------- Test set: org.eclipse.microprofile.metrics.tck.metrics.MultipleMetricsConstructorBeanTest ------------------------------------------------------------------------------- Tests run: 1, Failures: 0, Errors: 0, Skipped: 0, Time elapsed: 3.943 sec - in org.eclipse.microprofile.metrics.tck.metrics.MultipleMetricsConstructorBeanTest ------------------------------------------------------------------------------- Test set: org.eclipse.microprofile.metrics.tck.metrics.MultipleMetricsMethodBeanTest ------------------------------------------------------------------------------- Tests run: 2, Failures: 0, Errors: 0, Skipped: 0, Time elapsed: 3.882 sec - in org.eclipse.microprofile.metrics.tck.metrics.MultipleMetricsMethodBeanTest ------------------------------------------------------------------------------- Test set: org.eclipse.microprofile.metrics.tck.metrics.OverloadedTimedMethodBeanTest ------------------------------------------------------------------------------- Tests run: 2, Failures: 0, Errors: 0, Skipped: 0, Time elapsed: 5.374 sec - in org.eclipse.microprofile.metrics.tck.metrics.OverloadedTimedMethodBeanTest ------------------------------------------------------------------------------- Test set: org.eclipse.microprofile.metrics.tck.metrics.SimpleTimerFieldBeanTest ------------------------------------------------------------------------------- Tests run: 1, Failures: 0, Errors: 0, Skipped: 0, Time elapsed: 3.389 sec - in org.eclipse.microprofile.metrics.tck.metrics.SimpleTimerFieldBeanTest ------------------------------------------------------------------------------- Test set: org.eclipse.microprofile.metrics.tck.metrics.SimpleTimerFunctionalTest ------------------------------------------------------------------------------- Tests run: 1, Failures: 0, Errors: 0, Skipped: 0, Time elapsed: 105.1 sec - in org.eclipse.microprofile.metrics.tck.metrics.SimpleTimerFunctionalTest ------------------------------------------------------------------------------- Test set: org.eclipse.microprofile.metrics.tck.metrics.SimpleTimerTest ------------------------------------------------------------------------------- Tests run: 4, Failures: 0, Errors: 0, Skipped: 0, Time elapsed: 4.93 sec - in org.eclipse.microprofile.metrics.tck.metrics.SimpleTimerTest ------------------------------------------------------------------------------- Test set: org.eclipse.microprofile.metrics.tck.metrics.SimplyTimedClassBeanTest ------------------------------------------------------------------------------- Tests run: 2, Failures: 0, Errors: 0, Skipped: 0, Time elapsed: 3.936 sec - in org.eclipse.microprofile.metrics.tck.metrics.SimplyTimedClassBeanTest ------------------------------------------------------------------------------- Test set: org.eclipse.microprofile.metrics.tck.metrics.SimplyTimedConstructorBeanTest ------------------------------------------------------------------------------- Tests run: 1, Failures: 0, Errors: 0, Skipped: 0, Time elapsed: 3.426 sec - in org.eclipse.microprofile.metrics.tck.metrics.SimplyTimedConstructorBeanTest ------------------------------------------------------------------------------- Test set: org.eclipse.microprofile.metrics.tck.metrics.SimplyTimedMethodBeanLookupTest ------------------------------------------------------------------------------- Tests run: 3, Failures: 0, Errors: 0, Skipped: 0, Time elapsed: 5.962 sec - in org.eclipse.microprofile.metrics.tck.metrics.SimplyTimedMethodBeanLookupTest ------------------------------------------------------------------------------- Test set: org.eclipse.microprofile.metrics.tck.metrics.SimplyTimedMethodBeanTest ------------------------------------------------------------------------------- Tests run: 3, Failures: 0, Errors: 0, Skipped: 0, Time elapsed: 5.964 sec - in org.eclipse.microprofile.metrics.tck.metrics.SimplyTimedMethodBeanTest ------------------------------------------------------------------------------- Test set: org.eclipse.microprofile.metrics.tck.metrics.TimedClassBeanTest ------------------------------------------------------------------------------- Tests run: 2, Failures: 0, Errors: 0, Skipped: 0, Time elapsed: 3.861 sec - in org.eclipse.microprofile.metrics.tck.metrics.TimedClassBeanTest ------------------------------------------------------------------------------- Test set: org.eclipse.microprofile.metrics.tck.metrics.TimedConstructorBeanTest ------------------------------------------------------------------------------- Tests run: 1, Failures: 0, Errors: 0, Skipped: 0, Time elapsed: 3.957 sec - in org.eclipse.microprofile.metrics.tck.metrics.TimedConstructorBeanTest ------------------------------------------------------------------------------- Test set: org.eclipse.microprofile.metrics.tck.metrics.TimedMethodBeanLookupTest ------------------------------------------------------------------------------- Tests run: 3, Failures: 0, Errors: 0, Skipped: 0, Time elapsed: 6.426 sec - in org.eclipse.microprofile.metrics.tck.metrics.TimedMethodBeanLookupTest ------------------------------------------------------------------------------- Test set: org.eclipse.microprofile.metrics.tck.metrics.TimedMethodBeanTest ------------------------------------------------------------------------------- Tests run: 3, Failures: 0, Errors: 0, Skipped: 0, Time elapsed: 5.995 sec - in org.eclipse.microprofile.metrics.tck.metrics.TimedMethodBeanTest ------------------------------------------------------------------------------- Test set: org.eclipse.microprofile.metrics.tck.metrics.TimerFieldBeanTest ------------------------------------------------------------------------------- Tests run: 1, Failures: 0, Errors: 0, Skipped: 0, Time elapsed: 4.37 sec - in org.eclipse.microprofile.metrics.tck.metrics.TimerFieldBeanTest ------------------------------------------------------------------------------- Test set: org.eclipse.microprofile.metrics.tck.metrics.TimerTest ------------------------------------------------------------------------------- Tests run: 17, Failures: 0, Errors: 0, Skipped: 0, Time elapsed: 79.818 sec - in org.eclipse.microprofile.metrics.tck.metrics.TimerTest ------------------------------------------------------------------------------- Test set: org.eclipse.microprofile.metrics.tck.tags.CounterFieldTagBeanTest ------------------------------------------------------------------------------- Tests run: 2, Failures: 0, Errors: 0, Skipped: 0, Time elapsed: 3.463 sec - in org.eclipse.microprofile.metrics.tck.tags.CounterFieldTagBeanTest ------------------------------------------------------------------------------- Test set: org.eclipse.microprofile.metrics.tck.tags.GaugeTagMethodBeanTest ------------------------------------------------------------------------------- Tests run: 2, Failures: 0, Errors: 0, Skipped: 0, Time elapsed: 3.499 sec - in org.eclipse.microprofile.metrics.tck.tags.GaugeTagMethodBeanTest ------------------------------------------------------------------------------- Test set: org.eclipse.microprofile.metrics.tck.tags.HistogramTagFieldBeanTest ------------------------------------------------------------------------------- Tests run: 2, Failures: 0, Errors: 0, Skipped: 0, Time elapsed: 3.463 sec - in org.eclipse.microprofile.metrics.tck.tags.HistogramTagFieldBeanTest ------------------------------------------------------------------------------- Test set: org.eclipse.microprofile.metrics.tck.tags.MeteredTagMethodBeanTest ------------------------------------------------------------------------------- Tests run: 1, Failures: 0, Errors: 0, Skipped: 0, Time elapsed: 3.74 sec - in org.eclipse.microprofile.metrics.tck.tags.MeteredTagMethodBeanTest ------------------------------------------------------------------------------- Test set: org.eclipse.microprofile.metrics.tck.tags.SimplerTimerTagFieldBeanTest ------------------------------------------------------------------------------- Tests run: 1, Failures: 0, Errors: 0, Skipped: 0, Time elapsed: 3.866 sec - in org.eclipse.microprofile.metrics.tck.tags.SimplerTimerTagFieldBeanTest ------------------------------------------------------------------------------- Test set: org.eclipse.microprofile.metrics.tck.tags.SimplyTimedTagMethodBeanTest ------------------------------------------------------------------------------- Tests run: 1, Failures: 0, Errors: 0, Skipped: 0, Time elapsed: 3.416 sec - in org.eclipse.microprofile.metrics.tck.tags.SimplyTimedTagMethodBeanTest ------------------------------------------------------------------------------- Test set: org.eclipse.microprofile.metrics.tck.tags.TagsTest ------------------------------------------------------------------------------- Tests run: 8, Failures: 0, Errors: 0, Skipped: 0, Time elapsed: 3.361 sec - in org.eclipse.microprofile.metrics.tck.tags.TagsTest ------------------------------------------------------------------------------- Test set: org.eclipse.microprofile.metrics.tck.tags.TimedTagMethodBeanTest ------------------------------------------------------------------------------- Tests run: 1, Failures: 0, Errors: 0, Skipped: 0, Time elapsed: 3.365 sec - in org.eclipse.microprofile.metrics.tck.tags.TimedTagMethodBeanTest ------------------------------------------------------------------------------- Test set: org.eclipse.microprofile.metrics.tck.tags.TimerTagFieldBeanTest ------------------------------------------------------------------------------- Tests run: 1, Failures: 0, Errors: 0, Skipped: 0, Time elapsed: 3.419 sec - in org.eclipse.microprofile.metrics.tck.tags.TimerTagFieldBeanTest ------------------------------------------------------------------------------- Test set: org.eclipse.microprofile.metrics.test.MpMetricTest ------------------------------------------------------------------------------- Tests run: 47, Failures: 0, Errors: 0, Skipped: 0, Time elapsed: 10.98 sec - in org.eclipse.microprofile.metrics.test.MpMetricTest ------------------------------------------------------------------------------- Test set: org.eclipse.microprofile.metrics.test.ReusedMetricsTest ------------------------------------------------------------------------------- Tests run: 4, Failures: 0, Errors: 0, Skipped: 0, Time elapsed: 6.534 sec - in org.eclipse.microprofile.metrics.test.ReusedMetricsTest ------------------------------------------------------------------------------- Test set: org.eclipse.microprofile.metrics.test.multipleinstances.MultipleBeanInstancesTest ------------------------------------------------------------------------------- Tests run: 3, Failures: 0, Errors: 0, Skipped: 0, Time elapsed: 5.294 sec - in org.eclipse.microprofile.metrics.test.multipleinstances.MultipleBeanInstancesTest ------------------------------------------------------------------------------- Test set: org.eclipse.microprofile.metrics.test.optional.MpMetricOptionalTest ------------------------------------------------------------------------------- Tests run: 20, Failures: 0, Errors: 0, Skipped: 0, Time elapsed: 26.091 sec - in org.eclipse.microprofile.metrics.test.optional.MpMetricOptionalTest Results : Tests run: 233, Failures: 0, Errors: 0, Skipped: 0
