Histogram (Eclipse MicroProfile 3.3)

All Superinterfaces:

Counting, Metric, Sampling
```
public interface Histogram
extends Metric, Sampling, Counting
```
A metric which calculates the distribution of a value.

See Also:

Accurately computing running variance

Method Summary

All Methods Instance Methods Abstract Methods
Modifier and Type	Method	Description
`long`	`getCount()`	Returns the number of values recorded.
`Snapshot`	`getSnapshot()`	Returns a snapshot of the values.
`void`	`update(int value)`	Adds a recorded value.
`void`	`update(long value)`	Adds a recorded value.

- Method Detail
  - update
```
void update(int value)
```
    Adds a recorded value.
    
    Parameters:
    
    value - the length of the value
  - update
```
void update(long value)
```
    Adds a recorded value.
    
    Parameters:
    
    value - the length of the value
  - getCount
```
long getCount()
```
    Returns the number of values recorded.
    
    Specified by:
    
    getCount in interface Counting
    
    Returns:
    
    the number of values recorded
  - getSnapshot
```
Snapshot getSnapshot()
```
    Description copied from interface: Sampling
    
    Returns a snapshot of the values.
    
    Specified by:
    
    getSnapshot in interface Sampling
    
    Returns:
    
    a snapshot of the values